摘要
解决了LCD控制电路主芯片对带铆接屏蔽壳主板内部的耦合干扰所产生电磁辐射的优化问题;采用模拟退火法优化带接地铆接点的个数,最大限度的减少谐振频率的出现,使目标函数的电场强度最小,对屏蔽层的穿透能力最弱,辐射干扰最低。实验数据证明,模拟退火算法是优化产品结构参数的有效手段。
The optimization problem of the electromagnetic radiation produced by coupling interference in riveted shielding enclosure based on the chip for the control circuit of LCD is settled here. By using the method of simulated annealing algorithm, the number of grounded and riveted points is optimized in order to minimize its resonant frequency and electric field intensity of the objective function. Moreover, the weakest penetrating power and the lowest conduct disturbance for the shielding enclosure are attained. The experimental results show that simulated annealing algorithm is an effective way to optimize structural parameters of products.
出处
《盐城工学院学报（自然科学版）》
CAS
2014年第3期22-25,共4页
Journal of Yancheng Institute of Technology:Natural Science Edition
关键词
模拟退火法
接地铆接点
电磁辐射
优化问题
电场强度
simulated annealing algorithm
grounded and riveted points
electromagnetic radiation
optimization problems
electric field intensity
