摘要
利用透射电子显微技术对不同条件下生长的 KDP晶体中包裹物进行了观察并测量了其相应尺寸。结果表明 ,晶体中的生长缺陷、p H值、生长速度和杂质与
Scatter particles in KDP crystal grown from different conditions are observed and measured by TEM.The results show that growth defects,growth velocity,pH values and impurities are the reasons of causing the formation of scatter particles in KDP crystal.
出处
《压电与声光》
CSCD
北大核心
2002年第4期303-305,共3页
Piezoelectrics & Acoustooptics