飞行时间二次离子质谱在生物材料和生命科学中的应用(下)

Applications of Time-of-Flight Secondary Ion Mass Spectrometry in Biomaterials and Life Science(Part Ⅱ)

随着仪器性能的不断提高,飞行时间二次离子质谱(TOF-SIMS)在材料表面化学分析中起着越来越重要的作用。TOF-SIMS的主要测试功能包括表面质谱、化学成像及深度剖析,本工作对TOF-SIMS的化学成像及深度剖析2种功能在生物材料和生命科学中的应用做了简单综述,重点介绍了TOF-SIMS成像技术在生物芯片制备工艺中的应用和TOF-SIMS成像和深度剖析技术对生物分子在细胞和生物体组织上空间分布的表征方法;另外,对生物样品的低温制备方法,样品表面添加基质以增强信号强度的实验手段,使用团簇一次离子源提高分子二次离子产额和利用对样品损伤小的C60离子源为轰击源做深度剖析等实验做了简单的介绍;最后,对TOF-SIMS在生物生命材料领域的应用做了展望。

Time-of-flight secondary ion mass spectrometry（TOF-SIMS） is becoming an important technique for chemical surface analysis since its instrumental performance has been kept improved. The major analytical functions of TOF-SIMS include surface mass spectrometry, chemical mapping and depth profiling. This paper as the second part of the review titled as ＂Applications of Time-of-Flight Secondary Ion Mass Spectrometry （TOF- SIMS） in Biomaterials and Life Science＂ introduced the applications of TOF-SIMS imaging and depth profiling in biomaterials and life science. Three major applications were discussed： how TOF-SIMS imaging technique was used as an important diagnosis tool for bioarray fabrication, and TOF-SIMS imaging arid depth profiling characterization of biomolecule distribution in cell and tissue. In addition, the following experimental aspects were briefly described： sample preparation at low temperature, matrix-enhanced SIMS tech-nique, using cluster primary ion to increase molecular secondary ion yield, as well as depth profiling using C60 ion source which bring lest damage to underlying materials during the sputtering process. Finally, an outlook for the application of TOF-SIMS in biomaterials and life science was given.