温度-压强耦合并行激发主动拆卸结构的设计方法研究

Research on Design Methods of Active Disassembly Structure Triggered by Temperature-pressure Coupling

目前的主动拆卸结构的拆解一般应用单一物理场激发,在极端环境或意外环境中可能会发生主动拆解,产品可靠性不高,针对此,研究了温度-压强耦合并行激发主动拆卸结构的激发原理和特点,提出了温度-压强耦合并行激发主动拆卸结构的设计方法,并通过案例分析,验证了该设计方法的可行性。研究结果表明:应用温度-压强耦合并行激发的主动拆卸结构作为连接单元的产品,其可靠性大幅度提高。

Active disassembly structures are usually triggered by single physical field .These struc-tures can be triggered automatically in extreme or accidental circumstances ,thus causing the low relia-bility of products .For improving the reliability of active disassembly products ,this paper expounded the triggering mechanism and characteristics of active disassembly structure triggered by temperature-pressure coupling ,and studied the design principles and methods of active disassembly structure triggered by temperature-pressure coupling .The feasibility of these design methods was proved by a case analysis .The results show that the reliability of active disassembly structures triggered by tem-perature-pressure coupling is improved greatly .