单晶金微米片的电磁场增强及伴随的SERS效应

Electric Field Enhancement and Concomitant SERS Effects of Gold Microplates

我们通过SERS的方法研究了单个金微米片表面不同区域的电磁场增强。首次对单个金属粒子采用拉曼区域成像的方法为电磁场增强提供了直接的实验证据。用结晶紫作为探针分子,通过对金微米六边形及截断的金微米三角形的SERS研究,直接证明金属粒子的边和角比面的电磁场增强更强。排除分子吸附、杂质干扰、晶体缺陷、表面活性剂等因素的影响,最后得出金微米片上电磁场增强的强弱顺序是角#边#面。

The local electric field enhancement at various regions of individual gold microplates has been demonstrated by SERS.This work provides,for the first time,direct experimental evidence of localized enhancement of Raman signals on single gold microplates,using Raman mapping image.Raman images were collected from gold microhexagon and truncated triangular,using adsorbed crystal violet as the probe molecule.Confocal Raman studies provided direct proof for the substantial electrical field enhancement at the edges and corners compared to the face of the gold microplates.Ignore the effect of molecular adsorption and other interference factors,the electric field enhancement was in the order,corner〉edge〉surface.