摘要
In this paper,equivalent energy method is introduced for measuring mass thickness of dual-component samples using dual-energy X-rays.Approximately,the method adopts equivalent mass attenuation coefficients of the two components in mass thickness measurements for dual-component samples,in a certain range of thicknesses.Feasibility of the method is proven by numerical calculations and Monte Carlo simulations(EGSnrc package).The results of absorption experiments using an X-ray machine at tube voltages of 30 and 45 kV,the relative errors are less than 5%between the nominal and detected values.Also,optical low energy is discussed at given high voltages.
In this paper,equivalent energy method is introduced for measuring mass thickness of dual-component samples using dual-energy X-rays.Approximately,the method adopts equivalent mass attenuation coefficients of the two components in mass thickness measurements for dual-component samples,in a certain range of thicknesses.Feasibility of the method is proven by numerical calculations and Monte Carlo simulations（EGSnrc package）.The results of absorption experiments using an X-ray machine at tube voltages of 30 and 45 kV,the relative errors are less than 5%between the nominal and detected values.Also,optical low energy is discussed at given high voltages.
基金
Supported by Nanjing Institute of Technology(No.121107090001)
