期刊文献+

温度和应变率对低银无铅焊料力学行为的影响 被引量:6

Effect of Temperature and Strain Rate on Dynamic Mechanical Properties of Low Silver Lead-Free Solder
原文传递
导出
摘要 在不同工况下,采用电子万能材料试验机和分离式霍普金森压杆装置(SHPB)对低银无铅焊料Sn0.3Ag0.7Cu分别进行准静态和动态实验,分析了应变率和温度对Sn0.3Ag0.7Cu动态力学性能的影响。结果表明:低银焊料Sn0.3Ag0.7Cu的应力-应变曲线具有温度软化效应与应变率硬化效应。在不同的温度范围内,应变率硬化效应与温度软化效应对低银焊料Sn0.3Ag0.7Cu的塑性变形的影响是不同的。基于Johnson-Cook模型对实验数据进行拟合、修正得到低温和中高温下Sn0.3Ag0.7Cu的动态本构关系,并且与实验数据进行比较,两者在材料的塑性平台区表现出高度的一致性。 The mechanical properties of low silver lead-free solder Sn0.3Ag0.7Cu were characterized by an electronic universal material testing system and Split Hopkinson Pressure Bar (SHPB) under different working conditions. The influence of strain rate and temperature on the dynamic performance was analyzed. The results show that the stress-strain curves of low silver solder Sn0.3Ag0.7Cu are influenced by temperature softening and strain rate hardening effects. In different temperature ranges, strain rate hardening and temperature softening effects on the plastic deformation of low silver solder Sn0.3Ag0.7Cu are different. The dynamic constitutive relationship was determined through these experiments based on Johnson-Cook model. In the plastic flat phase of Sn0.3Ag0.7Cu, the dynamic constitutive relationship and experimental data have a good agreement
出处 《稀有金属材料与工程》 SCIE EI CAS CSCD 北大核心 2014年第9期2167-2171,共5页 Rare Metal Materials and Engineering
基金 河北省自然科学基金(A2012201003) 河北大学引进人才基金(2010-187)
关键词 低银无铅焊料 霍普金森压杆 温度效应 应变率效应 Johnson-Cook模型 low silver lead-free solder SHPB temperature effect strain rate effect Johnson-Cook model
  • 相关文献

参考文献5

二级参考文献58

  • 1Tu K N, Gusak A M. Physiea and materials challeges for lead-free solders[J]. Journals of Applied Physics, 2003, 93(3):1335-1353.
  • 2Syed A, Kim T S, Cho Y M, et al. Alloying effect of Ni,Co and Sb in SAC solder for improved drop performance of chip scale package with Cu OSP pad finish[C] //8th Electronic Packaging Technology Conference,6-8 December, 2006, Pan Pacfic Hotel, Singapore:404-411.
  • 3Eveloy V, Ganesan S, Fukuda Y, et al. Are you ready for lead-free electronics[J].IEEE Transactions on Components and Packaging Tecnology, 2005, 28(4): 884-894.
  • 4Sundelin J J, Nurmi S T,Lepiso T K, et al. Mechanical and microstructural propeties of SnAgCu solder joints[J].Materials Science and Engineering: A, 2006, 420(1-2): 55-62.
  • 5Terashima S, Kariya Y, Hosoi T, et al.Effect of silver content on thermal on thermal fatigue life of Sn-xAg-0.5Cu flip-chip interconnections[J]. Journal of Electronic Materials, 2003, 32(12):1527-1533.
  • 6Kim K S, Huh S H and Suganuma K. Effects of cooling speed on microstructure and tensile properties of Sn-Ag-Cu alloys[J]. Materials Science and Engineering A, 2002, 333(1-2): 106-114.
  • 7Kim K S, Huh S H and Suganuma K.Effects of fourth alloying additive on microstruetures and tensile properties of Sn-Ag-Cu alloy and joints with Cu[J]. Microelectronics Reliability, 2003, 43(2):259-267.
  • 8Anderson I E.Development of Sn-Ag-Cu and Sn-Ag-Cu-X alloys for Pb-free electronic solder applications[J].Journal of Materials Science:Materials in Electronics, 2007, 18(1-3): 55-76.
  • 9Sun F, Hochstenbach P, Van Driel V D, et al. Fracture morphology and mechanism of IMC in low-Ag solder/UBM (Ni(P)-Au) for WLCSP[J].Microelectronics Reliability,2008,48(8-9):1167-1170.
  • 10Pandher R S,Lewis B G, Vangaveti R,et al.Drop shock reliability of lead-free alloys-Effect of micro-additives[C] //57th Electronic Components and Technology Conference,29 May-1 June,2007,Reno,Nevada,USA:669-676.

共引文献38

同被引文献30

引证文献6

二级引证文献18

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部