玉米大斑病感、抗近等基因系SNP基因芯片分析

SNP Gene Chip Analysis of Near-isogenic Lines to North Corn Leaf Blight

通过SNP基因芯片(56 110个SNP)对A619感、A619Ht3抗玉米大斑病近等基因系进行分析,采用生物信息学和比较基因组学方法进行显著SNP位点候选基因筛查和功能预测。结果表明,发现10个热点区域,分别位于bin2.06、3.02/3.03、3.04、3.07、3.08、7.03和bin9.08,38个SNP被确定与大斑病抗性相关;挖掘出24个候选基因,通过注释发现,候选基因多与各种受体类酶活性、金属离子及能量的代谢和平衡等功能相关。

A pair near-isogenic lines of north corn leaf blight using of SNP gene chip（56 110 SNP） was ana- lyzed. Through bioinformatics and comparative genomics analysis, potential genes screening and function prediction were performed. Thirty-nine SNP were identified associated with resistance, ten candidate area were positioned, lo- cated bin2.06, 3.02/3.03, 3.04, 3.07, 3.08, 7.03 and bin9.08. Twenty-four candidate genes were digged out. The function included a variety of kinase activity, metal ion,energy metabolism and balance.