基于March C-算法的SRAM芯片的SEU失效测试系统

An SEU Failure Testing System of SRAM Chips Based on March C-Algorithm

为实现SRAM芯片的单粒子翻转故障检测,基于LabVIEW和FPGA设计了一套存储器测试系统:故障监测端基于LabVIEW开发了可视化的测试平台,执行数据的采集、存储及结果分析任务,板卡测试端通过FPGA向参考SRAM和待测SRAM注入基于March C-算法的测试向量,通过NI公司的HSDIO-6548板卡采集2个SRAM的数据,根据其比较结果判定SEU故障是否发生。该系统可以实时监测故障状态及测试进程,并且具有较好的可扩展性。

For testing the single event upset fault of SRAM chips, a memory testing system based on LabVIEW and FPGA has been designed. A visual test bench for failure monitoring was developed based on LabVIEW. It could perform the tasks of data acquisition, storage and results analysis. At the testing board, the March C- based test vectors are written to the reference SRAM and the testing SRAM through FPGA. NI HSDIO-6548 boards were used to collect the data of two SRAMs, determined whether SEU failure occurred according to comparison results. The system could accomplish the work of real-time monitoring the fault status and test process with a good extensibility.