ZTS晶体缺陷的实时AFM观测

In situ AFM observations on the defects of ZTS crystals

利用原子力显微镜(AFM)对硫脲硫酸锌(ZTS)(100)面的生长过程进行实时观测研究,发现晶体表面凹陷及杂质对台阶推移的阻碍作用均有可能导致凹坑的出现;大台阶对凹坑和杂质的覆盖是包裹体产生的重要原因。首次观察到杂质分界点现象,不可移动杂质的存在不会终止台阶的推移。

The real-time growth process of the (100)face of zinc tris-thiourea (ZTS)was observed using in situ atomic force microscopy (AFM).It comes out that pits could be result from the hollow surface and impurities on crystal surface that block up step advancement.The coverage by the macrostep of pits and impurities is the basic cause for inclusion generation.The impurity pinning phenomenon of ZTS was observed for first time.Im-mobile impurities didn’t terminate the advancement of steps.