耦合隐马尔科夫在模拟电路故障预测中的应用

Application of coupled hidden markov in fault prediction of analog circuit

为了能够更准确地对模拟电路系统中各退化状态进行状态识别和故障预测,针对单一通道的隐马尔可夫模型在模拟电路系统中预测精度不高的特点,提出了一种具有2条Markov链的耦合隐马尔可夫模型故障预测方法。该方法在模拟电路中采用2个测试点通过双通道数据分别对各退化状态和全寿命进行建模,实验结果表明,耦合隐马尔可夫模型与传统的隐马尔可夫模型相比,不但提高了状态识别率,而且能对电路系统的故障发生进行有效地预测,为状态维修提供依据。

In order to more accurately simulate the circuit system each state recognition of degraded state and failure prediction, proposed coupled hidden Markov model with two Markov chains as fault prediction method. The method uses two test points through dual-channel data for each degraded state and the whole life separately modeling, the results show that the coupled hidden Markov model compared with the traditional hidden Markov model, not only to improve the recognition of the state rate, but also to effectively predict the failure of the circuit system, provide the basis for state maintenance.