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Structure and Growth Mechanism of V/Ag Multilayers with Different Periodic Thickness Fabricated by Magnetron Sputtering Deposition 被引量:1

Structure and Growth Mechanism of V/Ag Multilayers with Different Periodic Thickness Fabricated by Magnetron Sputtering Deposition
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摘要 V/Ag multilayers with different periodic thicknesses were fabricated by magnetron sputtering deposition. The columnar structure and the orientation relationship of the multilayers were investigated by transmission electron microscopy, high resolution transmission electron microscopy, selected-area electron diffraction and X-ray diffraction. It was found that the multilayered structure became flatter as increasing individual layer thickness from 2 to 6 nm, and then became waved as the individual layer thickness increases to 8 nm. At the beginning of the growth, the morphology of the multilayers with small periodic thickness was influenced mainly by thermodynamic instabilities, and the morphology of the multilayers with larger periodic thickness was mainly influenced mainly by the columnar growth of V. When the waved interfaces were formed, the continuum growth of the multilayers was also influenced by the shadowing effect and the finite atomic size effect. All of these factors resulted in the columnar structure of the multilayers. Multilayers with small periodic thickness presented strong orientation relationship. Nano-hardness tests indicated that multilayers with flat sublayer morphology and clear interfaces exhibited larger hardness. V/Ag multilayers with different periodic thicknesses were fabricated by magnetron sputtering deposition. The columnar structure and the orientation relationship of the multilayers were investigated by transmission electron microscopy, high resolution transmission electron microscopy, selected-area electron diffraction and X-ray diffraction. It was found that the multilayered structure became flatter as increasing individual layer thickness from 2 to 6 nm, and then became waved as the individual layer thickness increases to 8 nm. At the beginning of the growth, the morphology of the multilayers with small periodic thickness was influenced mainly by thermodynamic instabilities, and the morphology of the multilayers with larger periodic thickness was mainly influenced mainly by the columnar growth of V. When the waved interfaces were formed, the continuum growth of the multilayers was also influenced by the shadowing effect and the finite atomic size effect. All of these factors resulted in the columnar structure of the multilayers. Multilayers with small periodic thickness presented strong orientation relationship. Nano-hardness tests indicated that multilayers with flat sublayer morphology and clear interfaces exhibited larger hardness.
出处 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2014年第10期1012-1019,共8页 材料科学技术(英文版)
基金 the National Natural Science Foundation of China(Nos.91026014 and 11175133) the Foundations from Chinese Ministry of Education(Nos.2011014113004 and NCET-13-0438) the Hubei Provincial Natural Science Foundation(No.2012FFA042) for financial support
关键词 MULTILAYERS INTERFACES Columnar structure Transmission electron microscopy Multilayers Interfaces Columnar structure Transmission electron microscopy
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