摘要
Passive intermodulation(PIM) has gradually become a serious electromagnetic interference due to the development of high-power and high-sensitivity RF/microwave communication systems, especially large deployable mesh reflector antennas. This paper proposes a field-circuit coupling method to analyze the PIM level of mesh reflectors. With the existence of many metal–metal(MM) contacts in mesh reflectors, the contact nonlinearity becomes the main reason for PIM generation. To analyze these potential PIM sources, an equivalent circuit model including nonlinear components is constructed to model a single MM contact so that the transient current through the MM contact point induced by incident electromagnetic waves can be calculated. Taking the electric current as a new electromagnetic wave source, the far-field scattering can be obtained by the use of electromagnetic numerical methods or the communication link method. Finally, a comparison between simulation and experimental results is illustrated to verify the validity of the proposed method.
Passive intermodulation(PIM) has gradually become a serious electromagnetic interference due to the development of high-power and high-sensitivity RF/microwave communication systems, especially large deployable mesh reflector antennas. This paper proposes a field-circuit coupling method to analyze the PIM level of mesh reflectors. With the existence of many metal–metal(MM) contacts in mesh reflectors, the contact nonlinearity becomes the main reason for PIM generation. To analyze these potential PIM sources, an equivalent circuit model including nonlinear components is constructed to model a single MM contact so that the transient current through the MM contact point induced by incident electromagnetic waves can be calculated. Taking the electric current as a new electromagnetic wave source, the far-field scattering can be obtained by the use of electromagnetic numerical methods or the communication link method. Finally, a comparison between simulation and experimental results is illustrated to verify the validity of the proposed method.