摘要
介绍LED产品常见的失效分析手段,主要包含外观检查、电性能测试、X-Ray透视检查、开封检查、金相切片分析、扫描电镜和能谱分析等手段,并结合实际案例对几种方法进行描述。
This paper introduces the common means of LED failure analysis, mainly including visual inspection, electrical performance test, X-Ray inspection, decapsulation inspection, microsection inspection, SEM ＆ EDS analysis, etc., and it describes these methods combined with actual cases.
出处
《环境技术》
2014年第5期52-55,共4页
Environmental Technology
关键词
LED
失效分析
X-RAY
开封
金相切片
扫描电镜
能谱仪
LED failure analysis X-Ray decap microsection SEM （scanning electron microscope） EDS （energy disperse spectroscopy）
