双面镜结构成像光谱仪的改进及性能分析

Improvement and Performance Analysis of the Double Sided Mirror Structure Imaging Spectrometer

针对目前双面镜结构成像光谱仪的可分辨最短波长为实际最短波长的2倍,存在分辨率浪费的问题,提出1种改进型结构,即在原菲涅尔双面镜干涉结构的基础上,移动双面镜使其从交接处分离。研究表明,改进型结构可使双面镜结构成像光谱仪可分辨的最短波长与实际最短波长一致,波长最小分辨率提高1倍,这对提升成像光谱仪的光谱检测性能具有重要意义。

In view of the resolution wasting problem of double sided mirror structure imaging spectrometer that the spectrometer＇s distinguishable shortest wavelength is the twice actual wavelength, an improved double imrror structure was proposed. The two plane mirros were seperated from their junction on the basis of the original Fresnel double mirror interference structure. Results show that the distinguishable shortest spectral of the spectrometer with the improved structure is of the same as the actual simulation, and the wavelength minimum resolution is doubled. This result is of great significance to enhance the imaging spectrometer＇s spectral detection performance.