双层金属腔体贯通导线HEMP耦合特性分析

Analysis on HEMP Effects of Double Metal Cavities with Penetrated Wire

电磁脉冲(EMP)对电子设备构成严重威胁,研究电子设备HEMP效应是电磁兼容与电子设备安全领域的迫切需求。多层金属腔体是电子设备较为常见的一种结构形式,以一种带贯通导线的双层金属腔体为研究对象,基于时域有限差分方法(FDTD)建立计算模型,分析计算了贯通导线在高空核爆电磁脉冲(HEMP)入射波作用下对腔体内电路的耦合效应。仿真结果表明,贯通导线能将入射脉冲能量耦合进腔体内部,使内电路负载产生感应电流,当入射电场与贯通导线平面相互平行时影响较大,但相互垂直时仍会耦合一部分能量。所得结论可为多层腔体的电磁防护设计提供依据。

Electromagnetic pulses（ EMP） have a serious threat on electronic equipment,so the study of HEMP effects is an urgent task in the fields of electromagnetic compatibility and electronic equipment safety. Multi-layer metal cavities are common structures of electronic equipment,so the paper focuses on a kind of double wall cavities with penetrated wire. Based on the finite difference time domain method（ FDTD）,it analyses and calculates the internal circuit coupling effects of the penetrated wire in a structure of double wall cavities under the high- altitude electromagnetic pulse（ HEMP） plane wave. The results show that the penetrated wires couple the incident pulse energy into the internal cavity,so load current is induced in the internal circuit; there is a greater impact when the incident electric field is parallel to the plane of the penetrated wires,but when they are perpendicular to each other,part of the energy is still coupled. The conclusions provide a reference for the electromagnetic protective design of multi- layer cavities.