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An Alternating-Current Voltage Modulated Thermal Probe Technique for Local Seebeck Coefficient Characterization 被引量:1

An Alternating-Current Voltage Modulated Thermal Probe Technique for Local Seebeck Coefficient Characterization
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摘要 Nanostructured and nanocomposite thermoelec- tric materials have recently attracted a great deal of attention due to the optimization of thermal and electrical transports for high thermoelectric performance The initial ideas for the applica- tions of nano-structures in thermoelectric materials are that the lattice thermal conductivity can be de- pressed by the scattering of nano-particles or nano- boundaries as well as the enhanced electron density of states at the Fermi level. The latter is expected to enhance Seebeck coefficients due to the fact that the low energy carriers can be filtered by nano-sized grain boundaries. Lowered thermal conductivity and enhanced thermoelectric figure of merit have been ob- served in lots of bulk materials with nanostructures or nano-impurities. However, the thermal and electrical transports in these nano-materials are usually mea- sured by normal commercial systems, in which only the statistical values of the transports are obtained. The characterization of local thermoelectric parame- ters still remains a challenging task at the submicro, even nanometer level as a powerful tool for Scanning probe microscopy nanostructure imaging and local properties characterization, has become a promis- ing technique for measuring local thermal and electri- cal properties, like scanning tunneling microscopy, scanning thermal microscopy, and scanning Joule expansion microscopy. Recent work has demon- strated simultaneously determined the thermal con- ductivity and Seebeek coefficient of Bi2Se3 thin film by a microprobe technique. Nanostructured and nanocomposite thermoelec- tric materials have recently attracted a great deal of attention due to the optimization of thermal and electrical transports for high thermoelectric performance The initial ideas for the applica- tions of nano-structures in thermoelectric materials are that the lattice thermal conductivity can be de- pressed by the scattering of nano-particles or nano- boundaries as well as the enhanced electron density of states at the Fermi level. The latter is expected to enhance Seebeck coefficients due to the fact that the low energy carriers can be filtered by nano-sized grain boundaries. Lowered thermal conductivity and enhanced thermoelectric figure of merit have been ob- served in lots of bulk materials with nanostructures or nano-impurities. However, the thermal and electrical transports in these nano-materials are usually mea- sured by normal commercial systems, in which only the statistical values of the transports are obtained. The characterization of local thermoelectric parame- ters still remains a challenging task at the submicro, even nanometer level as a powerful tool for Scanning probe microscopy nanostructure imaging and local properties characterization, has become a promis- ing technique for measuring local thermal and electri- cal properties, like scanning tunneling microscopy, scanning thermal microscopy, and scanning Joule expansion microscopy. Recent work has demon- strated simultaneously determined the thermal con- ductivity and Seebeek coefficient of Bi2Se3 thin film by a microprobe technique.
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2014年第12期92-94,共3页 中国物理快报(英文版)
基金 Supported by the National Basic Research Program of China under Grant Nos 2012CB933004 and 2015CB654605, the Na- tional Natural Science Foundation of China under Grant No 51121064, and the Nanotechnology Project of Shanghai Science and Technology Committee under Grant No 11nm0502800.
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