一种光电码盘缺陷检测方法的FPGA实现

FPGA Realization of a Detection Method of Photoelectric Encoder Defect

光电码盘在实际研究和使用过程中遇到的质量问题,如码道有亮点或暗斑、码道间相位差误差过大等缺陷,会严重影响光电编码器的测量精度。提出一种新式码盘缺陷检测方法,通过FPGA仿真分析实现检测码道上亮点或暗斑位置以及各码道间的相位差,并确定相位差误差大小。通过实验仿真验证了所提出方法的有效性和可行性。

The defects such as light or dark spots on the code channel and too big error of phase difference among code channels will seriously affect the measurement accuracy of the optical encoders.Aiming at these problems,a new detection method of coded disc defects was proposed to use FPGA emulation to realize the detection of both the locations of the light or dark spots on the code channel and the phase difference among code channels.And the value of phase difference error can be confirmed.