E-fuse阵列高效率测试验证方案及实现

High efficiency testability validation method for E-fuse array

随着电编程熔丝(E-fuse)技术在集成电路领域中的应用越来越广泛,对测试验证环节的要求也越来越高,测试人员也面临更大的挑战,因此在电编程熔丝开发过程中,如何提高E-fuse测试验证效率是研究的重点和难点之一。基于E-fuse阵列在测试验证上的效率低、样品需求多、数据分析难等问题,对现有的测试验证方法提出了一种E-fuse阵列bits层面上实现编程的测试方案。相比较传统测试流程,该方案可以节省38.8%甚至90%以上的测试验证时间,同时还具有测试设置方便、样品需求少、数据精确度高等特性。

As electrically programmable fuse （E-fuse） becomes broadly used in integrated circuits applications,the demand on testability validation becomes higher.How to efficiently develop testability validation methods become an important and difficult challenging research issue for testing engineers.The traditional serial E-fuse validation method requires lengthy test time and many samples with difficult test data analysis.In view of the above issues,this paper introduces a highly efficient E-fuse testability validation and evaluation method with bit level programming technology.Compare to the traditional serial E-fuse testing,this bit level programming methodology can save 38.8％ （up to more than 90％） of the validation time.This new methodology also has the advantage of convenient testing setup,requires fewer samples,and results in more accurate E-fuse elements testing confirmation.