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一种改进的随机存储器自检测March算法 被引量:2

An Improved Algorithm for Random Access Memory Self-test
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摘要 本文对随机存储器各类故障的失效机制和当前已有的解决算法做了简要介绍,进而对该问题更好的解决和各个指标的优化平衡提出了一种改进的March算法,从而达到了较高的故障覆盖率。 This article briefly introduces the failure mechanism of various types of faults and existing solutions of the Random Access Memory, and proposes an improved March algorithm to solve the problem and balance the various indicators to achieve a higher fault coverage.
出处 《船电技术》 2014年第12期53-55,共3页 Marine Electric & Electronic Engineering
关键词 嵌入式RAM 自检测试 MARCH算法 故障覆盖率 embedded RAM Self-test March algorithm fault coverage
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参考文献5

  • 1S.Kirmura,E.M Clarke.A parallel algrithm for bonary decision diagrams.IEEE International Conference on Computer Design,1990:220-223.
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二级参考文献5

  • 1ROCH IT RAJSUMAN System-on-a-chip Design and Test, USA: Advantest America R&D Center, Inc, 2000:57-156.
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  • 3陈光聥,张世箕.数据域测试及仪器(第三版).成都:电子科技大学出版社.2001.
  • 4WEI-LUN WANG, KUEN-JONG LEE, JHING-FA WANG. An On-Chip March Pattern Generator for Testing Embedded Memory Cores [J].IEEE Transaction on Very Large Scale Integration Systems, 2001; 9(5):730-735.
  • 5王淑波,代晶,姜丽莉.一种单片机控制的指令转换器的设计[J].微计算机信息,2004,20(1):58-60. 被引量:5

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