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用于10^(-6)N~10^(-5)N微力测量的柔性铰链机构设计 被引量:4

Design of Flexure Hinge Mechanism for 10^(-6)N~10^(-5) N Micro Force Measurement
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摘要 在基于静电场原理的微纳力值测量系统中,力值的传递与转化机构起着至关重要的作用。选择平行四边形柔性铰链机构作为其弹性元件,以实现10-6N量级的力值测量。分析了柔性铰链的数学模型,研究了其静态与动态刚度;根据系统要求确定了柔性铰链的目标刚度,并采用有限元方法对其进行优化设计和模态分析;分析了加工精度对铰链刚度的影响。将该铰链用于微力测量系统中,通过实验给出了刚度测试结果和力值测量结果,实验表明,该平行四边形柔性铰链满足微力测量系统对10-6N量级的力值测量要求。 In a micro-nano force measurement system based on the principle of static electric field,the mechanism used for force transmission and transformation plays a vital role. The parallelogram flexible hinge mechanism is used as elastic element,in order to realize the measurement of force on the scale of 10^-6 N. The mathematical model of the flexible hinge is analyzed to study the static and dynamic stiffness. The theory stiffness is determined according to the system requirement. The finite element method is used for the optimization design and modal analysis. The in-fluence to the hinge stiffness of the machining accuracy is analyzed. The stiffness test and force value measurement results are given by experiments. Results show that the parallelogram flexible hinge can be used in the force meas-urement system on the scale of 10^-6 N.
出处 《传感技术学报》 CAS CSCD 北大核心 2014年第11期1451-1456,共6页 Chinese Journal of Sensors and Actuators
基金 国家科技支撑计划项目(2011BAK15B06)
关键词 微力测量 柔性铰链 有限元 刚度 micro force measurement flexible hinge finite element stiffness
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  • 1Pratt J R,Kramar J A,Newe11 D B,et al. Review of SI Traceable Force Metrology for Instrumented Indentation and Atomic Force Microscopy [ J ]. Measurement Science and Technology,2005,16( 11 ) :2129.
  • 2张军,李寒光,李映君,钱敏.压电式轴上六维力传感器的研制[J].仪器仪表学报,2010,31(1):73-77. 被引量:28
  • 3Pratt J R, Kramar J A. SI Realization of Small Forces Using an E- lectrostatic Force Balance [ C ]//CD Proc XVIII IMEKO Worht Congress on Metrology for a Sustainable Development, Rio de Ja- neiro, Brazil, September. 2006 : 17-22.
  • 4Pratt J R,Newell D B,Kramar J A,et al. Realizing and Dissemina- ting the SI Micronewton with the Next Generation NIST Electrostatic Force Balance [ C ]//Proc ASPE 2004 Annual Meeting ( Orlando, FL). 2004.
  • 5Kim M S, Pratt J R, Brand U, et al. Report on the First International Comparison of Small Force Facilities : A Pilot Study at the Micronewton Level[ J]. Metrologia,2012,49( 1 ) :70.
  • 6Chen Shengiui ,Pan Sheaushi. A Force Measurement System Based on Anelectrostatic Sensing and Actuating Technique for Calibrating Force in Amicro-Newton Range with a Resolution of Nanonewton Scale [ J ]. Measurament Science and Technology,2011 (22) : 1001-1008.
  • 7Chen S J, Pan S S. Nanonewton Force Generation and Detection Based on a Sensitive Torsion Pendulum IEEE Trans Instrum [ J ]. Meas, 2009,5 : 8 897-901.
  • 8盛阳,赵美蓉,刘明,齐永岳,林玉池.超微力发生系统及其电容采集模块的设计[J].传感技术学报,2010,23(10):1505-1509. 被引量:12
  • 9刘明,林玉池,郑叶龙,靳展,刘铮.利用静电场原理复现微小力值的实验研究[J].传感技术学报,2012,25(1):33-37. 被引量:7
  • 10左行勇,刘晓明.三种形状柔性铰链转动刚度的计算与分析[J].仪器仪表学报,2006,27(12):1725-1728. 被引量:42

二级参考文献70

共引文献98

同被引文献39

  • 1郑红梅,刘正士,王勇.机器人六维腕力传感器标定方法和标定装置的研究[J].计量学报,2005,26(1):43-45. 被引量:19
  • 2周兆敏,杨德邻.高精度电子天平设计中的几个问题[J].仪器仪表学报,1989,10(1):3-10. 被引量:8
  • 3左行勇,刘晓明.三种形状柔性铰链转动刚度的计算与分析[J].仪器仪表学报,2006,27(12):1725-1728. 被引量:42
  • 4卢哓光.压电薄膜微力传感器特性研究[D].硕士学位论文.大连:大连理工大学,2007.
  • 5Willemsen O H, Snel M M E, Cambi A, et al. Biomolecular Inter- actions Measured By Atomic Force Microscopy [J]. Biophys, 2000 (79) :3267-81.
  • 6Min- Seok Kim, Jon R Pratt. SI Traceability: Current Status and Future Trends for Forces Below 10 Micro Newtons [J].Measure- ment,2010(43) : 169-182.
  • 7Min-Seok Kim, Jon R Pratt, Uwe Brand, et al. Report on the First International Comparison of Small Foree Facilities : A Pilot Study at the Micronewton Level [ J ]. Metrologia, 2012 (49) : 70-81.
  • 8Min-Seok Kim, Jae-Hyuk Choi, Yon-Kyu Park, et al. Atomic Force Microscope Cantilever Calibration Device for Quantified Force Metrology at Miero-Or Nano-Seale Regime:The Nano Foree Calibrator( NFC ) [ J ]. Metrologia, 2006 (43) : 389-395.
  • 9Ingo Behrens, Lutz Doering, Erwin Peiner. Piezoresistive Cantile- ver as Portable Micro Force Calibration Standard [J].Journal of Micromechanics and Microengineering, 2003 (13) : S 171-S 177.
  • 10Diethold C, Kuehnel M, Hilbrunner F, et al. Determination of Force to Displacement Curves Using A Nanopositioning System Based on Electromagnetic Force Compensated Balances [J]. Mea- surement, 2014 ( 51 ) : 343 -348.

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