改进型双滤光片切换器(IR-CUT)测试机的设计

Design of an Improved Tester of Infrared-CUT

采用Microchip公司的16位高性能控制芯片,构建了改进型IR-CUT测试机,能实现多通道多次连续测试,测试时间间隔可调,支持三种供电电压模式选择。经过实践验证,测试机台运行稳定,测试过程安全可靠,方便常规作业。

The design described that we construct and improve the IR- CUT test machine by the high performance control chip. The machine is with the variable test time, and support three voltage modes. Through practical verification, the test machine could run steadily with the Safe and reliable test process.