IGBT加速老化实验研究

Research of IGBT accelerated aging test

绝缘栅双极型晶体管(IGBT)功率模块作为电力电子设备的关键器件被广泛应用,其工作寿命与可靠性将影响到整个装置或系统的正常运行,对于IGBT可靠性研究具有重要意义。IGBT加速老化实验是研究IGBT可靠性问题的重要方法,其在不改变产品故障机制的前提下,提高实验应力,加速产品的故障进程,能有效缩短实验时间,节约成本。分析了IGBT的失效机理,依据IEC标准,设计了IGBT直流功率循环加速老化实验,自行设计搭建了IGBT加速老化实验系统,能够完成器件的老化以及监测老化前后器件参数的变化。研究成果为IGBT模块的可靠性研究以及健康状态评估提供了重要依据。

Insulated gate bipolar transistor （IGBT） power module as the key device of power electronic devices was widely used. The normal operation of the whole device or system was influenced by the working life and reliability. Then, the research of its reliability was significant. Accelerated aging test was an important method to study IGBT reliability problems. In the precondition of not changing the failure mechanism, the testing stress was improved, failure process was accelerated, the test time was shorten and the cost was saved. The failure mechanism of IGBT was analyzed. According to the IEC standard, IGBT dc power cycle accelerated aging test was designed and accelerated aging test system was built. The system was able to age device and monitor the change of parameters before and after aging. Research results provide an important basis for the research on the reliability of IGBT module and evaluation of health condition.