粉尘对ICP-OES运行的影响及解决方法

Impact of Dust on Inductive Coupled Plasma- Optical Emission Spectroscopy( ICP- OES) and Solution

通过对电感耦合等离子体发射光谱仪(ICP-OES)外部和内部富集的粉尘进行分析,确定粉尘的形态和粒径,从而对ICP-OES的外部和内部系统进行了更新改造,大幅减少了粉尘对仪器运行的影响,降低了ICP-OES的维护频率和日常维护费用,延长了仪器的使用寿命,为其他大型精密仪器设备的防尘工作提供参考.

Dust collected from the inside and outside of an inductively coupled plasma atomic emission spectrometer （ ICP-OES ） was analyzed inoder to obtain the morphology and particle size of dust. By adding protection appliances to the external and internal system of ICP-OES such as air circulation and filtration systems, the frequency of maintenance equipment was dramatically decreased and the routine maintenance costs was decreased too. Furthermore, the life of the instrument was extend after the reform of ICP-OES, and a reference was provided for other large-scale precision instruments and equipment.