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基于HFSS的高速互连BGA焊点信号完整性仿真分析 被引量:10

Analysis of Signal Integrity of the High-speed Interconnects BGA Solder Joint Based on HFSS
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摘要 基于HFSS软件建立了球栅阵列(Ball Grid Array:BGA)焊点模型,获取了焊点表面电场强度分布和回波损耗,分析了信号频率对电场强度分布的影响以及信号频率、焊点最大径向尺寸、焊盘直径和焊点高度对焊点回波损耗的影响;对9种不同参数水平组合的BGA焊点回波损耗进行了极差分析。结果表明:焊点内电场强度随频率增加而减小;回波损耗随信号频率升高和焊点最大径向尺寸增大而增大、随焊盘直径增大和焊点高度增高而减少;对信号完整性影响由大到小依次为:焊点高度、焊盘直径、频率和焊点最大径向尺寸。 The BGA solder joint simulation model was built by HFSS software, both of the electric field strength distribution and the return loss of BGA solder joints were obtained. The impacts of signal frequency on electric field strength distribution and the impacts of signal frequency, solder joint maximum radial size, pad diameter and solder joint height on return loss were also studied; the return loss range analysis of BGA solder joints which has 9 different process parameters' levels combinations was performed. Studying results show that the electric field strength decreases as signal frequency increased; The return loss increases as the signal frequency and the maximum radial size of the solder joint increased, and decreases as the pad diameter and the height of solder joint increased; The impact sequence of process parameters on signal integrity from high to low are the solder joint height, pad diameter, signal frequency and the solder joint maximum radial size.
出处 《系统仿真学报》 CAS CSCD 北大核心 2014年第12期2985-2990,共6页 Journal of System Simulation
基金 国家自然科学基金(51465012) 广西壮族自治区自然科学基金(2012GXNSFAA053234 2013GXNSFAA019322) 四川省教育厅科研资助项目(13ZB0052)
关键词 BGA焊点 信号完整性 焊盘 回波损耗 正交试验 BGA solder joint signal integrity pad return loss orthogonal experiment
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参考文献5

  • 1Mao J-F, Li Z-E Analysis of the time response of multiconductor transmission lines with frequency-dependent losses by the method of convolution characteristics [J]. IEEE Trans. On MTT (SO018-9480), 1992, 40(4): 637-644.
  • 2Eric Bogatin. Signal Integrity: Simplified [M]. NJ, America: Prentice Hall, 2003, 9, 22: 2-3.
  • 3赵莲清,刘二利.PCB中过孔对高速信号传输的影响[J].印制电路信息,2009,17(9):46-47. 被引量:10
  • 4Zuowei Shen, Jian Tong. Signal integrity analysis of high-speed single-ended and differential vias [C]// 10th Electronics Packaging Technology Conference. Piscataway, USA: Inst. of Elec. and Elec. Eng. Computer Society, 2008: 65-70.
  • 5熊华清,李春泉,尚玉玲.BGA焊点空洞对信号传输性能的影响[J].半导体技术,2009,34(10):946-948. 被引量:13

二级参考文献9

  • 1王文利,梁永生.BGA空洞形成的机理及对焊点可靠性的影响[J].电子工艺技术,2007,28(3):157-159. 被引量:28
  • 2Martin Graham.PH.D.High-speed Digital Design,AHandbook of Black Magic.University of California at Berkeley.
  • 3E.Laermans,J.De Geest,D.De Zutter,et al.Modelingdifferentialvia holes[J].IEEE ransactionson AdvancedPackaging,vol.24,no.3,pp357-363,2001.
  • 4User's guide-high frequency structure simulator[Z].Ansoft Corporation,2005.
  • 5Constantine A.Balanis,Advanced Engineering Electromagnetics.John Wiley & Sons,New York,1989.
  • 6LEE N. Voiding in BGA [C] // Proc of Surface Mount International. San Jose, California, 1995.
  • 7BOGATION E.信号完整性分析[M].李玉山,李丽平译.北京:电子工业出版社,2005.
  • 8IPC .IPC-7095A. Design and assembly process implementation for BGAs [S].
  • 9江进国,毛志兵,孙煜,何翅飞.BGA焊点气孔对可靠性的影响及其改善措施[J].焊接技术,2007,36(4):66-69. 被引量:6

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