等厚干涉的条纹宽度变化与球面的径向应变率关系的研究

A Study on the Relations between the Change of the Fringe Width of Equal Thickness Interference and the Radial Strain Rate of Spherical Surface

等厚干涉的条纹宽度与薄膜厚度及入射光的波长宽度有关,因此可以通过测量等厚干涉的条纹宽度来测量入射光的波长宽度,以及通过测量条纹宽度变化率来测量曲面的变形率.

The fringe width of equal thickness interference is related with the air film thickness and wavelength width, thus the wavelength width can be got by measuring the fringe width, and the radial strain rate of spherical surface can also be got by measuring the change rate of the fringe width.