摘要
By using electron backscatter diffraction（EBSD） and transmission electron microscopy（TEM）, the effect of Si content on microstructure characteristics of three as-extruded Ale SieM g alloys was investigated. Results showed that the density of coarse Si particles played a critical role in dynamic recrystallization. Dynamic recrystallization rarely occurred in S1 alloy with less Si content; however, it happened in the Si-rich zones in S2 alloy with a medium Si content. And a mature recrystallization was observed in S3 alloy with high Si content. Although deformation was carried out at high temperature, particle-stimulated dynamic recrystallization occurred in Si-rich zones.
By using electron backscatter diffraction（EBSD） and transmission electron microscopy（TEM）, the effect of Si content on microstructure characteristics of three as-extruded Ale SieM g alloys was investigated. Results showed that the density of coarse Si particles played a critical role in dynamic recrystallization. Dynamic recrystallization rarely occurred in S1 alloy with less Si content; however, it happened in the Si-rich zones in S2 alloy with a medium Si content. And a mature recrystallization was observed in S3 alloy with high Si content. Although deformation was carried out at high temperature, particle-stimulated dynamic recrystallization occurred in Si-rich zones.
基金
financially supported by the Jiangsu Graduated-student Innovation Program of China (CXZZ-0146)
the Scientific Research Foundation of Graduate School of Southeast University (YBJJ1235)
