摘要
通过X射线衍射和化学分析等方法,研究了云南水电站断层泥中伊利石物理化学特征,结果显示:1伊利石物质的X射线衍射特征为Δ[(002)-(001)]>8,Ir>1,BB1<4°,属I+ISII有序混层,膨胀层小于15%,晶胞参数b0=8.991,1M多型结构;2K2O的平均含量9.1%变化范围在8.5%-10%之间;3K2O和Fe2O3含量之间为负相关,K2O含量与Δ[(002)-(001)]2θ值呈正相关,而K2O与Ir值呈负相关。上述特征表明该断层泥伊利石是在低温(小于200℃)低压环境下生成。它的形成与断层稳定滑动机制有关。由此推测该断层未来发生大地震的可能性较小。
The characteristics of minerals,such as illite,etc.in fault gouge from Xiaowan Fault are studied with X-ray diffraction and chemical analysis.The results show that:(1) X-ray diffraction features of illite are ⊿ [(002)-(001)] >8°,I,>1,BB1 <4°,belonging to orderly mixed layer.Expansive layer accounts are smaller than 15%.The crystal cell parameters b0=8.991 (A),1M polytype structure.(2) KO2 content varies from 4.18% to 5.56%.(3) There is negative correlation exists between K2O and Fe2O3.There is a positive correlation between ⊿ [(002)-(001)] and K2O,but negative correlation exists between K2O and Ir.All of characteristics suggest that illite was formed in the environment with low-temperature and low-pressure,which is related with the low level of fault activity and low probability of strong earthquake occurrence in future.
出处
《震灾防御技术》
CSCD
2014年第4期829-837,共9页
Technology for Earthquake Disaster Prevention
基金
国家自然科学基金(批准号:41172193
40572127
49772168)
中国地震局地质研究所基本科研业务专项(批准号:IGCEA-1107)
关键词
断层泥
伊利石
X射线衍射
化学分析
Fault gouge
Illite
X-ray diffraction
Chemical analysis