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薄膜干涉结构生色蚕丝织物的研制 被引量:8

Preparation of Structural Colored Silk Fabrics w ith Thin-film Interference
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摘要 结构生色是一种无污染的仿生着色技术。采用静电自组装法在蚕丝织物表面构建Si O2/聚乙烯亚胺(PEI)结构生色薄膜,研究自组装条件中水洗次数、纳米Si O2粒子分散液浓度和PEI溶液浓度等因素对构建结构生色薄膜的影响,确定有利于在蚕丝织物表面静电自组装纳米Si O2/PEI结构生色膜的条件为:水洗5次,纳米Si O2粒子分散液质量分数0.2%,PEI溶液质量分数0.1%。用数码相机、Digi Eye数慧眼系统和多角度分光光度仪表征蚕丝织物的结构色及其反射率光谱,并用场发射扫描电子显微镜观察织物表面纳米Si O2/PEI薄膜的形态结构,结果显示:研制的薄膜干涉结构生色蚕丝织物的生色机理符合单层薄膜干涉生色原理,且结构色随组装周期数、组装纳米Si O2粒子的粒径和观察角度而变化;蚕丝织物用纳米Si O2/PEI组装形成的结构生色膜薄而光滑,对织物的手感和弯曲性能无明显影响。 Structural coloration is a kind of environment-friendly biomimetic coloring technology. Si O2/ PEI( polyethyleneimine) film with structural colors on the surface of silk fabrics was fabricated by electrostatic self-assembly method. The effects of rinsing times,concentration of Si O2 nanoparticle solution and PEI solution on the fabrication of Si O2/ PEI film were investigated. The results showed that it was suitable for assembling Si O2/ PEI film with structural colors on the surface of silk fabrics under the conditions of rinsing times 5,mass concentration of Si O2 nanoparticle solution 0. 2%,and mass fraction of PEI solution 0. 1%. The structural colors of silk fabrics coated with Si O2/ PEI film were observed by digital camera and multi-angle spectrophotometer,the reflectance spectra were measured by Digi Eye system,and the morphological structure of Si O2/ PEI films on silk fabrics was observed by field emission scanning electron microscope. It was considered that the coloring mechanism of prepared silk fabrics was in agreement with the single thin-film interference theory,and the structural colors varied with the assembly cycles,the size of Si O2 nanoparticle and viewing angle. The film which assembled with nano-Si O2/ PEI on the surface of silk fabrics was thin and smooth,and had no obvious effect on hand-feeling and bending properties of silk fabrics.
出处 《蚕业科学》 CAS CSCD 北大核心 2015年第1期100-106,共7页 ACTA SERICOLOGICA SINICA
基金 国家自然科学基金项目(No.51073142)
关键词 蚕丝织物 结构色 静电自组装 纳米SI O2粒子 薄膜干涉 Silk fabrics Structural color Electrostatic self-assembly Si O2nanoparticle Thin film interference
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