摘要
为实现超小光学元件(直径小于φ15 mm)光谱参数的检测,在现有商用分光光度计的基础上,对设备进行了改进完善,通过在测试光路和参考光路增加衰减比相匹配的缩束小孔,成功实现了检测光束的缩束。实验结果表明:改进后的设备基线平直度不大于!0.001 A,标准元件检测结果与标定值偏差不超过0.05%。
In order to measure the spectral parameter of extra small optics which diameter is less than fifteen millimeter,commercial spectrophotometer was improved.Measure beam was shrinked successfully by setting the pinholes with suited attenuation ratio on both measure and reference beam.The experimental results show that the equipment baseline straightness is no greater than ±0.001 A after improvement,the deviation between the standard optics test results and the calibration value is no more than 0.05%.
出处
《科学技术与工程》
北大核心
2015年第3期216-219,共4页
Science Technology and Engineering
关键词
透射率
反射率
分光光度计
光学元件
小孔
衰减比
transmission reflectance spectrophotometer optics pinhole attenuation rat io