基于太赫兹光谱的平面应力测量方法

On the Plane Stress Measurement Method Based on Terahertz Spectroscopy

本文提出了一种基于太赫兹光谱技术的平面应力状态测量方法。该方法在传统的太赫兹时域光谱系统中引入起偏镜和检偏镜,实现了对太赫兹脉冲偏振态的调控。针对该实验系统,建立了试件所受应力与穿透试件的太赫兹波相位延迟之间的定量关系,并提出了根据实验所测太赫兹波相位延迟计算平面应力状态三个应力参量的数据处理方法。将该方法得到的实验结果和应变仪测量的结果作对比,发现两种方法有很好的一致性,证明此实验方法合理可靠。

In this paper,aplane stress state measurement method based on terahertz spectroscopy technique is proposed.This method introduces polarizer and analyzer into traditional terahertz timedomain spectroscopy（THz-TDS）system,then implements terahertz pulse polarization control.Using this experimental system,quantitative relation between the stress applied to specimen and the phase delay of terahertz wave penetrating specimen can be established,and data processing method for three stress parameters calculation in plane stress based on experimentally obtained terahertz wave phase delay is proposed.Compareson between the experimantal results from above-mentioned method and the results from strain-gauge measurement shows that both methods agree with each other,which validates the reasonablity and reliability of proposed method.