摘要
本文介绍了调制一条边缝光路位相的全息三缝干涉仪。其量程比调制中缝位相的三缝干涉仪扩大一倍,并能对大范围的连续光程变化进行测量。
A holographic three-slit interferometer is described in which the phase of one lateral slit is modulated.The measurement range of this apparatus is one time large than the ordinary three-slit interferometer. It can measure continous light path changes in a wide range.
出处
《中国激光》
EI
CAS
CSCD
北大核心
1991年第8期583-585,582,共4页
Chinese Journal of Lasers
关键词
全息干涉仪
干涉仪
光路
相位
调制
holographic three-slit interferometer, modulation of phase of one lateral slit, spatial diffraction spectrum
