期刊文献+

电学法热阻测试仪校准方法研究 被引量:3

Calibration Method of Thermal Resistance Tester Based on Electrical Method
下载PDF
导出
摘要 论文分析了电学法热阻测试仪的工作原理及测量过程,明确了测量过程中各个电、热参数对热阻测试结果的作用和意义。由热阻的基本定义出发,推导出了各种电热参数与热阻之间的测量模型,选择K系数测量电流的短期稳定性,电压测量值,加热电流和加热电压,加热平台温度,参考位置温度为主要校准参数。从整体校准的角度,给出了校准方法,分析了各种影响量引入的测量不确定度,给出了最终测量不确定度评定过程。为实现电学法热阻测试仪的整体校准奠定了基础。 In this paper,the basic principles about Thermal Resistance Tester Based on transient Electrical Method were given.The calibration parameters were chosen properly,such as the stability of IM,TSP voltage,heating voltage and heating current,and the calibration method.And then,the measurement model was given and the measurement uncertainty was calculated.A great effort had been done on the calibration of the thermal resistance tester.
出处 《计算机与数字工程》 2015年第1期1-3,149,共4页 Computer & Digital Engineering
关键词 电学法 热阻测试仪 校准 测量不确定度 electrical method thermal resistance tester calibration measurement uncertainty
  • 相关文献

参考文献10

  • 1Mali Mahalingam,Edward Mares. Thermal Measure-ment Methodology of RF Power Amplifiers[K]. Frees-cale Semiconductor Application Note, 2004: 1-3.
  • 2Zoltan Sarkany, Gabor Farkas, Marta Rencz. Thermaltransient characterization of pHEMT devices [C]//THERMINIC'12,2012 : 225-228.
  • 3V. Szekely. New approaches in the transient thermalmeasurements[J]. Microelectronics, 2000 (31): 727-733.
  • 4Electronic Industries Association, Integrated CircuitsThermal Measurement Method — Electrical TestMethod (Single Semiconductor Device) [〇L] [2014-07-28], EIA/JEDEC Standard, JESD51-1,1995 [www.jedec. org].
  • 5Electronic Industries Association. Transient Dual Inter-face Test Method for the Measurement of the ThermalResistance J unction-to-Case of Semiconductor Deviceswith Heat Flow Trough a Single Path[〇L]. EIA/JE-DEC Standard,JESD51-14,2010[www. jedec. org].
  • 6P. W. Webb, BSc, PhD, CEng,MIEE. Measurementof Thermal Resistance Using Electrical Methods [J].IEEE PROCEEDINGS-PART I,1987,134(2) :51-56.
  • 7王志田.无线电电子计量学[M].北京:原子能出版社,2002:830-834.
  • 8Mentor Graphics Corporation. T3Ster? MeasurementControl Tool User and Reference Guide[K]. MentorGraphics Corporation, 2014 : 49-59.
  • 9易本建.JJG(电子)04016-88《BJ2984(QR3)型晶体三极管瞬态热阻测试仪试行检定规程》[S].北京:电子工业出版社,1989:256-264.
  • 10叶德培,赵峰,施昌彦,等.JJF1059.1-2012测量不确定度的评定与表示[S].北京:国家质量监督检验检疫总局,2012:8-23.

共引文献1

同被引文献27

引证文献3

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部