摘要
FPGA是广泛应用于集成电路设计,片上系统等多领域,随着FPGA的广泛应用,对其可靠性的要求也越来越高,由于其结构和功能复杂,其测试难度和成本也随之增加。文章简要介绍了SRAM型FPGA的逻辑单元(LE)的结构,提出了一种基于扫描链的逻辑资源遍历测试方法。以Altera公司FPGA为例,简述了在超大规模集成电路测试系统CATT-400上实现FPGA在线配置和功能测试方法。
FPGA is widely used in the field of integrated circuit design,system on chip.With the extensive application of FPGA,the dependability of the FPGA is very complex,also it is harder and more expensive.The logic unit structure of type SRAM-based FPGA is introdueced,and a traversal test method based on the scan chain is presented.As an example of Altera＇s Cyclone series FPGA,the implementation method of online configuration and function test of the FPGA in the VLSI Test System CATT-400 is described.
出处
《计算机与数字工程》
2015年第1期65-69,共5页
Computer & Digital Engineering
关键词
FPGA
可编程逻辑单元
扫描链
重配置
自动化测试
field programmable gate array（FPGA）
logic elements（LE）
scan chain
partial reconfiguration
automatic test system（ATE）
