摘要
在调研国内外最新BIT技术发展的基础上,对该技术在星载电子设备应用的必要性及可行性进行分析,并利用分级思想构建适合星载电子设备的BIT测试体系,为星载电子设备的可测试性发展提供了一种思路.
In this paper the necessity and feasibility of the BIT（ built in test） technology is applied to the satellite electronic devices are analyzed,based on the investigation of the development of BIT technology.A BIT test system is constructed via using hierarchical ideology to suit for the satellite electronic equipment. A new method is proposed to develop the testability of satellite electronic equipment.
出处
《空间控制技术与应用》
CSCD
北大核心
2015年第1期50-54,共5页
Aerospace Control and Application
关键词
机内测试
星载电子设备
测试体系
分级思想
BIT
satellite electronic device
test architecture
hierarchical ideology
