期刊文献+

Magnetization reversal process in Fe/Si(001) single-crystalline film investigated by planar Hall effect

Magnetization reversal process in Fe/Si(001) single-crystalline film investigated by planar Hall effect
下载PDF
导出
摘要 A planar Hall effect(PHE) is introduced to investigate the magnetization reversal process in single-crystalline iron film grown on a Si(001) substrate.Owing to the domain structure of iron film and the characteristics of PHE,the magnetization switches sharply in an angular range of the external field for two steps of 90° domain wall displacement and one step of 180°domain wall displacement near the easy axis,respectively.However,the magnetization reversal process near the hard axis is completed by only one step of 90° domain wall displacement and then rotates coherently.The magnetization reversal process mechanism near the hard axis seems to be a combination of coherent rotation and domain wall displacement.Furthermore,the domain wall pinning energy and uniaxial magnetic anisotropy energy can also be derived from the PHE measurement. A planar Hall effect(PHE) is introduced to investigate the magnetization reversal process in single-crystalline iron film grown on a Si(001) substrate.Owing to the domain structure of iron film and the characteristics of PHE,the magnetization switches sharply in an angular range of the external field for two steps of 90° domain wall displacement and one step of 180°domain wall displacement near the easy axis,respectively.However,the magnetization reversal process near the hard axis is completed by only one step of 90° domain wall displacement and then rotates coherently.The magnetization reversal process mechanism near the hard axis seems to be a combination of coherent rotation and domain wall displacement.Furthermore,the domain wall pinning energy and uniaxial magnetic anisotropy energy can also be derived from the PHE measurement.
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第2期424-427,共4页 中国物理B(英文版)
基金 supported by the National Basic Research Program of China(Grant Nos.2011CB921801 and 2012CB933102) the National Natural Science Foundation of China(Grant Nos.11374350,11034004,11274361,11274033,11474015,and 61227902) the Research Fund for the Doctoral Program of Higher Education of China(Grant No.20131102130005)
关键词 magnetic thin film domain wall displacement planar Hall effect magnetic thin film, domain wall displacement, planar Hall effect
  • 相关文献

参考文献26

  • 1Wawro A, Suto S, Czajka Rand Kasuya A 2008 Nanotechnology 19 205706.
  • 2Zuti6 I, FabianJ and Sarma S D 2004 Rev. Mod. Phys. 76 323.
  • 3Liu H L, He W, Du H F, Fang Y P, Wu Q, Zhang X Q, Yang H T and Cheng Z H 2012 Chin. Phys. B 21 077503.
  • 4Garreau G, HaJ Jar S, BubendorffJ L. Pirri C, Berling D, Mehdaoui A, Stephan R, Wetzel P, Zabrocki S, Gewinner G, Boukari Sand Beaure?paire E 2005 Phys. Rev. B 71 094430.
  • 5Komogortsev S V, Varnakov S N, Satsuk S A, Yakovlev I A and Ovchinnikov S G 2014 1. Magn. Magn. Mater. 351 104.
  • 6Cowbum R P, Gray SJ and BlandJ A C 1997 Phys. Rev. Lett. 794018.
  • 7Cantoni M, Riva M, Bertacco Rand Ciccacci F 2006 Phys. Rev. B 74 134415.
  • 8Adeyeye A, Win M T, Tan T A, Chong G S, Ng V and Low T S 2004 Sensors and Actuators A: Physical 116 95.
  • 9McGuire T R and Potter RJ 1975 IEEE Trans. Magn. 111018.
  • 10YeJ, He W, Wu Q, Hu B, TangJ, Zhang X Q, Chen Z Y and Cheng Z H 2014 1. Appl. Phys. 115 123910.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部