摘要
提出了一种根据功率IGBT模块实时特征量对IGBT缺陷程度进行评估的新方法。首先从IGBT模块的结构入手,分析了其失效机理及故障特征。然后对IGBT模块进行人为挑断键合线实验,对获得的实验数据进行灰色关联模型建模,以初步验证灰色关联度与缺陷程度的关系;并进一步进行了老化试验,提出了灰色关联预计模型,通过实验验证了预测模型的正确性。该文研究成果为IGBT模块在线可靠性预测提供了参考依据。
A new method for assessing the power IGBT modules was proposed according to the amount of real-time characteristics of the IGBT defect levels. Started from the structure of IGBT module the failure mechanism,failure characteristics are analyzed. Experiments which artificially partially broke IGBT module wire bonding were done; the experimental data obtained were gray modeling related to the relationship between the initial verification and defect gray correlation degree. Further the aging test which can made a prediction model of gray association was completed.Experiments verify the correctness of the prediction model. The reliability of forecasts for the IGBT module in the study of this paper provides online reference.
出处
《电子器件》
CAS
北大核心
2015年第1期27-31,共5页
Chinese Journal of Electron Devices