新型单粒子效应测试系统控制程序的设计

A Novel Design of the Control Program for the Single Event Effects Testing System

半导体集成电路(Integrated Circuit,IC)在辐射环境中,容易受到单粒子效应(Single Event Effect,SEE)的影响而发生故障。为了测试集成电路的SEE敏感性,验证SEE加固方法,设计了一套SEE测试系统。介绍了SEE测试系统控制程序的设计。控制程序采用引导式的流程管理,可扩展的待测器件信息管理,多线程数据采集和处理方法以及可靠的数据接收方法等多种设计方法,提高了程序的运行效率,保证了实验数据接收和处理的实时性和可靠性,良好地支撑了SEE测试系统的运行工作。

Semiconductor integrated circuits（ ICs） are vulnerable to single event effects（ SEEs） in radiation environment. To evaluate the SEE susceptibility of the ICs,and to assess the schemes of SEE mitigation,a SEE testing system has been built up. This paper presents a design of the control program for this SEE testing system. Several advanced design approaches,such as the step- by- step style of the management of the testing process,the extensible information management of the devices under test,multithreading and the reliable receiving of the data,are adopted in the development of the program. The combination of these approaches makes the efficiency of the program higher,and ensures the reliability of the receiving and processing of the data. The control program cooperates well with the SEE testing system.