一种嵌入式边界扫描测试数据压缩及合成方法

Embedded Boundary-scan Solution Based on MCU

随着嵌入式测试概念的产生,边界扫描技术作为高密度电路板故障检测的主流技术,将结合嵌入式测试方法,成为板级乃至系统级故障检测的新研究方向;嵌入式边界扫描是电路板级故障检测的必然发展趋势;文中首先介绍了嵌入式边界扫描技术,然后提出了一种嵌入式边界扫描测试数据压缩及合成方法,阐述了嵌入式边界扫描的数据生成及下载,最后以某数字电路板为对象进行了嵌入式边界扫描测试验证,并给出结论;总体上,嵌入式边界扫描测试以增强测试自动化、提高测试覆盖率和测试效率为目的,能够更好地降低产品整个寿命周期的测试维修成本。

With the presence of embedded test, embedded test technology associates with Boundary--scan technology which has become a mainstream option in high--density circuit board fault detection. It is the new direction of DFT development both in board--level fault detection and in system--Ievel fault detection. In this paper, the embedded boundary--scan technology is introduced firstly. Then one embed- ded boundary--scan test data compression method and synthesis method are offered. And the embedded boundary--scan TPG （test pattern generation） and download are introduced. At last, the design and verification of embedded boundary--scan targeted at the digital circuit are presented. In a word, the embedded boundary--scan test is used to improve the test automation, the test coverage and the test efficiency. It can decrease the life cycle cost of test and maintenance greatly.