高分辨率X射线探测器读出电子学系统的研制及性能测试

Development and Performance Evaluation of Read-out Electronics System for High Resolution X-ray Detector

本文针对光锥耦合X射线探测器低噪声的设计要求,研制了一套读出电子学系统,该系统包括模拟驱动电路、前端处理电路及基于现场可编程门阵列（FPGA）的数字信号处理电路。利用X射线成像平台,对研发的探测器进行了性能测试。探测器系统绝对增益为0.168 6DN/e-,线性工作范围为0-154μGy。制冷温度为-20℃时,暗电流噪声为0.037e-/（pixel·s）,读出噪声为10.9e-。探测器的本征空间分辨率达16lp/mm。测试结果表明,研制的读出电子学系统能满足高分辨率X射线探测器对低噪声特性的需求。

An electronics system was developed according to the low noise requirement of FOT X‐ray detector in this paper .The electronics system consists of an analog drive circuit ,a front end processing circuit and a digital signal processing circuit w hich is based on field programmable gate array （FPGA ） . The performance of FOT X‐ray detector was evaluated on the X‐ray imaging platform . The overall system gain is 0.168 6 DN/e- ,and the linear operating range of the detector is 0‐154 μGy .When the cooling temperature reaches -20 ℃ ,the dark current noise is 0.037 e- /（pixel·s） and the read noise is 10.9 e- .The intrinsic spatial resolution of the detector is 16 lp/mm . The results indicate that the designed read‐out electronics system meets the require‐ments of high resolution X‐ray detector .