摘要
文章从可靠性的数学、物理基础出发,描述了现代可靠性工程,介绍了功率半导体的可靠性问题。以4045型IGCT器件为例,阐述了3种重要的加速试验,得到了相应的失效率曲线,给出了计算实例。
It described the modern reliability engineering based on math and physics. The reliability problems of power semiconductor devices were introduced. Three major acceleration tests were described by means of 4045 IGCT device and related failure rate curves were gained and some calculating instances were given as well.
出处
《大功率变流技术》
2015年第1期1-9,共9页
HIGH POWER CONVERTER TECHNOLOGY
