摘要
用衰减法和水标样法测量多孔SiO2的小角X光散射绝对强度,并以此计算样品中的空隙体积分数关系。将所得结果与用氮气吸附法得到的结果进行比较,表明了用标样法得到的结果更加接近于氮气吸附法测量得到的结果,因而间接地表明了标样法要比衰减法测得的小角散射绝对强度更加可靠。文章进一步讨论了这两种方法的特点以及误差产生的原因。该实验结果和讨论将有助于进一步加深对这两种绝对强度测试方法的理解,并在实验中选择合适的测量方法。
The absolute intensity of SiO2 were measured by attenuation method and standard method respectively in small angle x-ray scattering,and with them the pore volume fractions of the sample were calculated.By comparison of results from absolute intensity and that from nitrogen adsorption,we find the pore volume fractions from standard method is closer to that measured by nitrogen adsorption,which means the absolute intensity from standard method is more reliable than that from attenuation method.The paper further discussed the merits and demerits,and the source of errors of the both absolute intensity measurement methods.It will be helpful to deepen the understanding of the absolute intensity measurements,and choose the appropriate method in the experiments.
出处
《光散射学报》
北大核心
2015年第1期59-63,共5页
The Journal of Light Scattering
基金
国家自然科学基金资助项目(51101077)
关键词
小角X光散射
绝对强度
衰减法
标样法
small angle x-ray scattering
absolute intensity
attenuation method
atandard method