一种新的珍珠层厚度测量方法

A New Approach to Nacreous-Layer-Thickness Measurement

珍珠层厚度是珍珠价值最主要的衡量指标之一,目前珍珠层厚度的无损测量方法主要采用光学相干层析成像技术和X射线技术;光学相干层析成像技术在实际测量时精度较低;在研究X射线测量原理的基础上,提出了一种新的珠层厚度测量方法;首先介绍了灰度图像的边缘识别算法和珍珠核、珍珠外圆度拟合算法,其次提出了一种引入对照机制的珍珠层测量算法,最后还对算法的误差进行了分析,算法的误差可以控制在0.02%以内;实际的测量也验证了该测量方法具有很高的精度。

Nacreous--Layer--Thickness is one of the main indicators in pearl value estimation. Now Optical coherence tomography and X ray are two major nondestructive method used in Nacreous--Layer--Thickness measurement, but the precision of the Optical coherence tomography is relatively low. A new approach to Nacreous-- Layer-- Thickness measurement is presented based on the research of X ray measuring principle. Firstly the edge detection algorithm of gray image and roundness fitting algorithm of pearl and pearl nucleus are introduced, and a Nacreous--Layer--Thickness measurement algorithm with cross reference mechanism is presented secondly, finally the precision of the algorithm is also analysed, which is can be controlled in 0.02%. Actual measurement has proved the high precision of the new algorithm.