六级半导体制冷器工作特性的实验研究

Experimental Study on Operation Characteristics of A Six-stage Semiconductor Refrigerator

本研究搭建了六级半导体制冷器工作特性测试实验台。实验研究了不同输入电压、热端温度和外部散热情况等工况下六级半导体制冷器冷端温度的变化规律。结果表明:制冷器初始阶段的温降速率随输入电压的增大而增大,同一输入电压下的温降速率随着时间的推移逐渐减小;相比二级半导体制冷器,两者温降速率基本相同;所研究六级半导体的最佳输入电压为20 V^30 V;制冷器冷端温度随热端温度的上升而升高;外部环境绝热有利于降低冷端温度。

A testing platform for six-stage semiconductor refrigerator was built. Varying principles of the cold side temperature of a six-stage semiconductor refrigerator were experimentally investigated under the different conditions of input voltage, hot side temperature and external cooling characteristic. Results show that the temperature drop rate at the initial stage increases with the increasing input voltage; under the condition of the same voltage, the temperature drop rate decreases with time going on; compared with the two-stage semiconductor refrigerator, both of the temperature drop rates are basically the same; the most suitable input voltage of the six-stage semiconductor refrigerator is about 20 V-30 V; the cold side temperature rises along with the hot side temperature; the heat insulation of external environment is favorable to decrease the cold side temperature.