水稻种子接触静电对播种落地偏移量影响的试验与研究

Experiment and Research of Effect on Landing Offset of Seeds with Contact Static

在100 mm、150 mm、200 mm距地高度下,分别测量水稻种子在接触静电和未接触静电情况时,种子通过接触式静电试验装置后的落地偏移量。将三组对照试验的数据进行统计分析,试验结果表明：水稻种子接触带电后,种子落地偏移量明显减小;随种子距地高度的不断增加,种子落地偏移量也会变大;静电电压为17k V时,种子落地偏移量可比对照组平均减小5-9 mm。

The seeds from the ground height were 100,150 and 200 mm,and the landing offset of the seeds with contact and noncontact static were measured respectively by the static contact testing apparatus. The data of 3 groups of the controlled trials were analyzed,and the experimental results showed that the landing offset of seeds reduced significantly after contacting static,and the landing offset of seeds became large along with the increasing height. When the static voltage was 17 k V,the landing offset of rice seeds decreased 5-9 mm than that of control group on average.