刍议集成电路老化预测与容忍

Aging Prediction and Tolerance of Integrated Circuit

集成电路特有的制备工艺,正在不断拓展。电源电压被限缩,提升了原有的集成性能。这种情形下,集成电路关涉的多重产业,也在快速进展。然而,伴随性能渐渐完善,集成电路潜藏着的老化疑难,也在逐渐凸显。拟定好的特征尺寸缩减,各时段的负偏置温度,凸显了不稳定的总倾向[1]。为此,有必要明晰老化预测特有的多重属性,探究可用的容忍技术。

Integrated circuit production technology is continuously developing. The power supply voltage is reduced and the integrated circuit performance becomes better. However,with the perfect performance of integrated circuit,the aging problems of it are increasing. The feature size reduction of integrated circuit and the negative bias temperature instability in each period highlights a instable general tendency. Therefore,the aging prediction technology should be analyzed and the aging tolerance technology should be explored.