摘要
With the development of satellite based remote sensors, embedded systems become moreand more popular in space camera electronics. Static Random Access Memory(SRAM) is one kind of themost widely used memories due to its merits of high efficiency and low power dissipation, but testing itsfunction still depends on writing testing modules with hardware description language, which results in lowdeveloping efficiency and low reliability. In this paper, an embedded testing method is proposed, which isbased on MicroBlaze and its speed increasing function design. Implementation of the test method is basedon reusable Intellectual Property(IP) technique and greatly improves data transfer speed. With this method,secondary development of SRAM test system can be made in application layer instead of fundamentallogical layer, which simplifies the system design. It is not only more efficient and more reliable, but alsoeasier to transplant, which greatly reduces test design cost. The validity and feasibility of the method havebeen proved by test results.
出处
《太赫兹科学与电子信息学报》
2015年第2期352-356,共5页
Journal of Terahertz Science and Electronic Information Technology