光电探测器的黑白屏现象及相应阈值的测算方法

The Black and White Creen of Photodetectors and the Measurement Method of Corresponding Threshod

采用波长为532nm的低重频高能量脉冲激光从31.5m的距离处辐照可见光面阵CCD时,试验中观察到了可见光面阵CCD的黑白屏现象。提出了准确测算可见光面阵CCD出现黑白屏现象时光敏面上激光功率密度阈值的方法。通过调节入射激光的重复频率和在光路中添加合适倍率的衰减片,测得了CCD前置光学系统的增益为4.4×103,并最终获得了CCD出现黑白屏现象时光敏面上的激光功率密度阈值为4.49W/cm2。研究结果可为实施强激光对光电探测器的致盲干扰提供理论依据和数据参考。

The black and white screen of visible array CCD could be observed when it was irradiated by 532 nm pulsed laser with low repetition frequency and high energy from a distance of31.5m.The measurement method was proposed for the threshold of laser power density at the photosensitive surface when the black and white screen emerged.The gain of the front optical system was measured as 4.4×103 by changing the repetition frequency of incident laser and adding the right attenuation slices in light path,and finally the threshold of laser power density was calculated as 4.49W/cm2.