摘要
文章首先给出了一种紧缩场静区性能的检测方法,并以CCR75/60为例对检测数据与设计指标进行了对比,结果证明该紧缩场静区的性能指标完全满足指标要求。进而又介绍了在已知紧缩场静区性能的条件下,对测试结果进行补偿的方法。
First of all, a measurement method of compact range quiet zone performance was introduced. The quiet zone performance of this compact range is proved to be totally qualified by comparing the measured result of CCR75/60 to the design value. A correction method for testing result in condition of known CCR quiet zone performance is introduced as well.
出处
《空间电子技术》
2015年第2期16-19,共4页
Space Electronic Technology
关键词
紧缩场
静区性能
Compact range
Quiet zone
