摘要
空间环境中存在的大量粒子,其辐射效应,特别是单粒子效应,严重威胁着空间CMOS器件的可靠性。文章首先分析了几种典型的数字单粒子瞬态加固技术,并提出了一种适合接收数字波束形成ASIC的抗辐射加固电路结构。通过对标准ASIC设计流程进行改进,给出了抗辐射加固ASIC设计流程。基于该改进的ASIC设计流程,实现了接收DBF ASIC的研制。
The radiation effects of the particles in the space environment, especially single event effects, threaten to the reliability of CMOS device. In this paper, several custom DSET-hardened techniques have been analyzed firstly, and a radiation-hardened circuit suitable for receiving DBF ASIC design is proposed. Secondly, the standard design flow has been improved to provide the protection of digital ASICs against the radiation environment. As a result, the radiation hardened receiving DBF ASIC is implemented based on the improved design flow.
出处
《空间电子技术》
2015年第2期50-53,67,共5页
Space Electronic Technology
关键词
数字波束形成
抗辐射加固ASIC
单粒子瞬态
设计流程
Digital Beam Forming （DBF）
Radiation-Hardened ASIC
Single Event Transient （SET）
Design flow
